Scientific Committee (Preliminary)

Bertrand Audoin (University Bordeaux 1, France)
Oluwaseyi Balogun (Northwestern University, USA)
Paul C. Beard (University College London, UK)
Thomas Berer (RECENDT Research Center for Non Destructive Testing, Austria)
Shiro Biwa (Kyoto University, Japan)
Alain Blouin (National Research Council of Canada, Canada)
Claude Boccara (City of Paris Industrial Physics and Chemistry Higher Educational Institution, France)
Emmanuel Bossy (City of Paris Industrial Physics and Chemistry Higher Educational Institution, France)
Peter Burgholzer (RECENDT Research Center for Non Destructive Testing, Austria)
Hideo Cho (Aoyama Gakuin University, Japan)
Matt Clark (University of Nottingham, UK)
Steve Dixon (University of Warwick, UK)
Rachel Edwards (University of Warwick, UK)
Christ Glorieux (Catholic University of Leuven, Belgium)
Vitalyi Gusev (University of Maine, France)
Peter Hess (Heidelberg University, Germany)
Sohichi Hirose (Tokyo Institute of Technology, Japan)
David Hutchins (University of Warwick, UK)
Ikuo Ihara (Nagaoka University of Technology, Japan)
Alexander A. Karabutov (Moscow State University, Russia)
Sridhar Krishnaswamy (Northwestern University, USA)
Michal Landa (Academy of Sciences of the Czech Republic)
Seung-Seok Lee (Korea Research Institute of Standards and Science, Korea)
Osamu Matsuda (Hokkaido University, Japan)
Humphrey Maris (Brown University, USA)
Alexei Maznev (MIT, USA)
Tsuyoshi Mihara (University of Toyama, Japan)
Jean-Pierre Monchalin (National Research Council of Canada, Canada)
Todd Murray (University of Colorado, USA)
Hideo Nishino (The Universitiy of Tokushima, Japan)
Makoto Ochiai (Toshiba, Japan)
Hirotsugu Ogi (Osaka University, Japan)
Yukio Ogura (Japan Probe, Japan)
Yoshikazu Ohara (Tohoku University, Japan)
Ivan Pelivanov (University of Washington, USA)
Tomaz Pozar (University of Ljubljana, Slovenia)
Yoshihumi Saijyo (Tohoku University, Japan)
Jun Semboshi (Toshiba, Japan)
Bernhard Reitinger (RECENDT Research Center for Non Destructive Testing, Austria)
Motonobu Tomoda (Hokkaido University, Japan)
Herve Tretout (Dassault Aviation, France)
Shinichiro Umemura (Tohoku University, Japan)
Istvan A. Veres (RECENDT Research Center for Non Destructive Testing, Austria)
Hubert Voillaume (European Aeronautic Defense and Space, France)
Shusou Wadaka (Ryoden Shonan Electronics, Japan)
Oliver B. Wright (Hokkaido University, Japan)
Kazushi Yamanaka (Tohoku University, Japan)
Hao Zhang (Northwestern University, USA)
Shu-yi Zhang (Nanjing University, China)